M.P. Semenenko Institute of Geochemistry, Mineralogy and Ore Formation of NAS of Ukraine

Laboratory of electron microscopy

Department of diamond problems

      The laboratory has a raster electron microscope JSM-6700F with an energy-dispersive system for microanalysis JED-2300.

    Possible research: study of the morphology and microtopography of the surface of solid objects at magnifications from 25 to 650,000 times; semi-quantitative local determination of the chemical composition of solid inorganic objects (at the point Ǿ 3-5 μm). Chemical elements from Na to U.

       Sample preparation: for scanning electron microscopy and X-ray spectral microanalysis, samples must be cleaned. To inspect the internal structure, it is necessary to polish the surface. Conductive samples may not be sprayed. Non-conductive samples must be coated with a thin layer of carbon or platinum. Importantly!! The size of the samples should not exceed Ǿ 25 mm at a height of 10 mm and Ǿ 32 mm at a height of 20 mm.

          For microanalysis (determination of chemical composition), massive samples must have two flat parallel planes, one of which must be polished with an abrasive not larger than 0.1 μm. Microchips (less than 1 mm) must be mounted in an epoxy checker Ǿ 25 mm with a height of 10 mm, or Ǿ 32 mm with a height of 20 mm, brought to the surface and polished with an abrasive of no more than 0.1 μm.

 

Responsible: Oleksiy Anatoliyovych Vyshnevskyi, tel. 424-20-43, vyshnevskyy@igmof.gov.ua

 

 

Electron microscope JSM-6700F with an energy-dispersive system for microanalysis JED-2300

   

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

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